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Quanta™ Scanning Electron Microscope

The FEI Quanta™ line includes six variable-pressure and environmental scanning electron microscopes (ESEM™) and two DualBeam™ systems, all of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.


The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.

The Quanta SEM line now includes even more flexibility with the release of the Quanta 50 Series. These new instruments, the Quanta 250 , 450 , 650 , and 650 FEG address the need to investigate a wide variety of materials and characterize structure and composition. The FEI Quanta™ 50 series provides flexibility and versatility to handle the challenges of today's wide ranging research needs. View any sample and get all the data - surface and compositional images can be combined with accessories for determining material properties and elemental composition.

Quanta 50 Series

The Quanta 50 series adds new features such as SmartSCAN™, Multiple Image Saving and a scan preset toolbar to the easy to use control software. In addition, new features are available like the Nav-Cam™ (color sample camera), Beam Deceleration (low kV performance) and New detector options.

Quanta Morphologi

Quanta Morphologi combines the magnification and resolving power of the FEI Quanta 250 FEG scanning electron microscope (SEM) with established particle analysis software from Malvern Instruments to provide a turn-key solution for particle characterization. As opposed to indirect particle size analysis techniques, which report equivalent spherical diameter, Quanta Morphologi is a direct method to report both size and shape information.

    Life Sciences
  • 3D Cellular Ultrastructure and Architecture
  • Macromolecular Localization
  • Pharmaceutical Quality Control
  • 3D Tissue Imaging
  • Particle Analysis
  • Circuit Edit
  • Defect Analysis
  • TEM Lamella Preparation
  • in situ NanoProcesses
  • 3D Nanoprototyping
  • Soft Matter
  • Materials Qualification
  • High Quality Sample Preparation Using Focused Ion Beam
  • Nanometrology of Critical Dimensions at the Nanoscale
  • Gunshot Residue (GSR)
  • Criminal Evidence Imaging and Analysis