Park NX12

The most versatile AFM for analytical and electrochemistry

A versatile microscopy platform for analytical chemistry researchers and shared user facilities
Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities
Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)
Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration

Supplier: Park Systems