Themis S STEM for Semiconductors

Perfect combination of the best image resolution and the highest analytical efficiency
The Themis S S/TEM is an 80–200kV scanning / transmission electron microscope (S/TEM) designed for high-speed imaging and analysis of semiconductor devices. As the latest member of the industry-standard Themis family, the Themis S TEM inherits a unique combination of the best spatial resolution and the most efficient chemical analysis.

Supplier: Thermo Fisher