Electron Microscopy Supplies

Description

SCANNING ELECTRON MICROSCOPY

1. SEM Pin, M4 & Cylinder Specimen Mounts in Aluminum and Carbon
2. Wafer Holders for Notch-Style Wafers; 4–12″
3. Pelco® STEM Imaging Specimen Holders
4. AFM Mica Discs
5. New Pelco® EBSD Specimen Holders & Mounts
6. Silicon Chip Specimen Supports
7. Pelco Tabs™ Carbon Conductive Tabs, Double Coated
8. Pelco TEC™ SFG12 Finder Grid Substrate
9. Carbon Conductive Tape, Double Specimen Holder
10. Pelco® Conductive Graphite Paint
11. PIN Stub SEM Mount Grippers

TRANSMISSION ELECTRON MICROSCOPY

• TEM Specimen Support Grids

Calibration Standards for Transmission Electron Microscopy

• Combined TEM Test Specimen – Gold / Graphitized Carbon
• 500nm Diffraction Grating Replica with Latex Spheres
• Diffraction Standard – Camera Length
• Image Rotation
• 500nm Magnification Calibration Diffraction Grating Replica
• Gold Shadowed Latex