Verios G5 XHR SEM

Scanning electron microscopy characterization

• High resolution nanomaterial imaging with the UC+ monochromated electron source for sub-nanometer performance from 1-30 kV.
• High contrast on sensitive materials with excellent performance down to 20 eV landing energy and high-sensitivity in-column and below-the-lens detectors and signal filtering for low-dose operation and optimal contrast selection.
• Greatly reduced time to nanoscale information for users with any experience level using the Elstar electron column featuring SmartAlign and FLASH technologies.
• Consistent measurement results with ConstantPower lenses, electrostatic scanning and a choice of two piezoelectric stages.
• Flexibility for accessories with a large chamber.
• Unattended SEM operation with Thermo Scientific AutoScript 4 Software, an optional Python-based application programming interface.

Supplier: Thermo Fisher